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n&k Analyzer Accurately Measures the Thickness of Diamond-Like Coatings --DLC-- on Perpendicular Recording Media for Next Generation Disk Drives

Published on 2004-10-11. Author : SpecialChem

SANTA CLARA, Calif. -- n&k Technology, Inc., a manufacturer of proven, production-worthy systems for accurate, and precise thin film measurement for data storage, announced the development of a new software module that adds the capability to the n&k 1500-D Analyzer of characterizing Diamond-Like Coatings (DLC) on perpendicular recording media.

The software package enables the n&k 1500-D Analyzer user to effectively characterize the latest magnetic media that are substantially more complex than older generation media and allow much higher recording densities.

The data storage industry is rapidly moving to significantly higher recording densities in response to competition from FLASH memory and an increased penetration of the consumer market with such products as game boxes, DVR, in-car navigation, and various music and video players.

"Combined with the n&k 1500-D Analyzer that is used to characterize the latest Giant Magnetoresistive (GMR) heads, we offer a complete range of solutions for next generation disk drive metrology," states Dr. Rahim Forouhi, founder and president of n&k Technology.

About n&k Technology, Inc.

n&k Technology is a manufacturer of proven, production-worthy process diagnostic tools for reliable, accurate, and precise thin film characterization as well as trench and critical dimension measurements, serving a variety of industries including semiconductor, photo mask, flat panel display, and data storage. The company's cost-effective, easy-to-use systems, ranging from fully automated 300mm production tools down to table-top models, deliver "the true measure" with superior resolution, enabling users to characterize virtually any combination of thin films, micro features and substrates. n&k's products are also ideally suited for challenging integrated metrology applications.

Source: n&k Technology, Inc.


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